产品 – 第15页 – EMSIS ASIA – Electron Microscopy Imaging Company

EM-Tec RXS-10RA Raman mineral analysis test standard, 10 materials plus F/C on pin stub

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EM-Tec CV1 centering vise SEM sample holder for up to 110mm, pin

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EM-Tec M32 metallographic mount holder for Ø30mm / Ø32mm / Ø1-1/4inch mounts, M4

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Hitachi Ø15x6mm M4 cylinder SEM sample stub, aluminium

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JEOL Ø25x10mm cylinder SEM sample stub, aluminium

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Denka M3 LaB6 with 90° cone angle 20μm flat tip for FEI, Philips, Amray

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EM-Tec P12 multi pin stub holder for 12 pin stubs, Ø62×10.5mm, pin

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EM-Tec P4 multi pin stub holder for 4 pin stubs, Ø31.5×10.5mm, M4

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EM-Tec JS14 cylinder stub round clamp for up to Ø16mm, JEOL Ø25x10mm

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EM-Tec S-Clip sample holder with 1xS-Clip 45° on Ø25mm stub, M4

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EM-Tec FIB lift-out grids, Cu, 3 posts

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EM-Tec 4X.AM high precision reverse tweezers, style 4, very fine sharp tips, anti-magnetic stainless steel

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Value-Tec 4.NM general purpose tweezers, style 4, fine pointed tips, non-magnetic stainless steel

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Value-Tec 2X.NM general purpose tweezers, style 2X, reversed, pointed tips, non-magnetic stainless steel

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Micro-Tec B2 straight fine needle probe 0.25mm, black enameled steel, 35mm

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Micro-Tec MP2 probe with bend tip, 410 stainless steel

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Micro-Tec conductive silver grease, 7g syringe

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EM-Tec S-Clip sample holder with various number S-Clip on Ø100×4.5mm stub, M4

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Platinum Target,various disk sizes, 99.99% Pt

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EM-Tec TEM hexagonal mesh support grids, various Mesh, Various Materials

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SEM pin stub Ø32 diameter top, standard pin, aluminium

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Zeiss pin stub Ø63 diameter top, short pin, aluminium

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FEI F22 SEM stage adapter base, 20mm x M6F, aluminium

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Hitachi HV48-10 new style T-base SEM stage adapter assembly with 10mm extra height

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Micro-Tec MTC-5 Multiple target calibration standard with 4 patterns

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Denka M3 LaB6 with 90° cone angle 15μm round tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30

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EM-Tec TV12 mini variable 0-90° angle tilt sample holder 11x12mm, pin

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EM-Tec G2 twin geological thin sections holder for 2 petrographic slides up to 47x27mm, M4

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Hitachi Ø25x10mm M4 cylinder SEM sample stub, aluminium

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ISI/ABT/Topcon Ø15x10mm SEM cylinder sample stub, aluminium

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EM-Tec PS7 mini pin stub dual slot vise clamp, 2x1mm, Ø15x6mm, pin

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EM-Tec P49 multi pin stub holder for 49 pin stubs, Ø117x7mm, pin

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EM-Tec P7 multi pin stub holder for 7 x Ø25.4mm pin stubs, Ø78x15mm, M4

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EM-Tec S-Clip sample holder with 10xS-Clips at 90°, 50x10x14mm, pin

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EM-Tec single sided conductive copper SEM tape 6mm x 30m

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EM-Tec FSB100S FIB lift-out grid storage box with single clip

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EM-Tec 5.TI high precision tweezers, style 5, extra fine straight tips, titanium

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Value-Tec 220.PG glass fibre reinforced polyamide soft blunt tip with stainless steel handle

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EM-Tec 95.AM SEM stub gripper tweezers for Ø9.5mm cylinder stubs, anti-magnetic stainless steel

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Micro-Tec CT1 carbon fibre reinforced PVDF probe, fine pointed / strong flat

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Value-Tec G4P 4-prong pick-up tool, 116mm

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EM-Tec dual layer graphene TEM support film on Lacey carbon on 300 mesh copper grids

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LCS-10 Micro-Tec 10mm linear compound scale, 1, 0.1, 0.01mm div., Si/Cr, opaque, different mounts

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Gilder P TEM grid, parallel bar, various mesh, various material

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Gilder HEX TEM grid, standard, various hexagonal Mesh, various Materials

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Engraved SEM pin stub Ø32 diameter with 12 numbered fields, aluminium

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45/90 degree angled Zeiss pin stub Ø12.7 diameter, short pin, aluminium

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EM-Tec PJ50 pin stub adapter for Ø50mm JEOL stubs

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EM-Tec J25P JEOL Ø25mm adapter for pin stubs, Ø25x10mm

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EM-Tec CXS-5TX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub

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