产品 – 第15页 – EMSIS ASIA – Electron Microscopy Imaging Company

EM-Tec VS26 compact double action spring-loaded vise holder for up to 26mm, M4

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In-lens SEM mount type 1 for Hitachi SU9000, S-5500, S-5200 and S-5000

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JEOL Ø12.2x10mm cylinder SEM sample stub, aluminium

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Denka M3 LaB6 with Hitachi S-Type base, 60° cone angle, 5 μm sharp tip for S-, SU, H- and X-Series SEM and TEM

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EM-Tec J3 multi stub holder for 3 x Ø12.2mm JEOL stubs, Ø31.5x10mm, pin

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EM-Tec SC2R recessed SampleClamp SEM holder, 25x15mm sample area, M4

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EM-Tec JS2 mini cylinder stub tube/needle clamp Ø2mm, JEOL Ø12.2x10mm

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EM-Tec S-Clip sample holder with 4xS-Clips at 45° and 4xS-Clips at 90°, M4

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EM-Tec NI41 strong and good conductive nickel cement, 25g bottle

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EM-Tec 521.AM Gatan 3View stub handling tweezers, 118mm, anti-magnetic stainless steel

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Value-Tec 1.NM general purpose tweezers, style 1, strong fine pointed tips, non-magnetic stainless steel

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Value-Tec 686.MS industrial strong tweezers, style 686, bent smooth pointed tips, 178mm, magnetic stainless steel

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Micro-Tec NA4 angled fine needle probe 0.45mm, stainless steel, 35mm

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Value-Tec VP6 probe with sharp curved hook tip, round handle, 410 stainless steel

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Micro-Tec disposable carbon steel scalpels #15 with plastic handle, sterile

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EM-Tec S-Clip sample holder with various number S-Clip on Ø25x10mm stub, M4

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Nickel Target, various disk sizes, 99.98% Ni

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EMR Formvar Carbon support film on gold, various square mesh

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EM-Tec PS9 mini split mount vise 0 – 8mm, pin

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SEM pin stub Ø12.7 diameter top, standard pin, aluminium

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Zeiss pin stub Ø25.4 diameter top, short pin, aluminium

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EM-Tec PS4 pin stub adapter for Cambridge S4 mounts

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Hitachi HV40 older style T-base SEM stage adapter assembly, compatible with S-4700, S-4500, S-4300, S-42300, S-4100, S-4000, S-800 FESEMs and S-3600N SEM

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EM-Tec MCS-0.1CF certified calibration standard, 2.5mm to 100nm

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Hitachi V-Loop (10/Box)

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EM-Tec M26 metallographic mount holder for 25mm / 1inch mounts, pin

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EM-Tec M51 metallographic mount holder for 50mm / 2inch mounts, M4

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Hitachi Ø15x10mm M4 dish SEM sample stub, aluminium

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JEOL Ø25x16mm angled SEM sample stub with double 90 degree, aluminium

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EM-Tec PS8 pin stub round clamp up to Ø6mm, Ø12.7×7.2mm, pin

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EM-Tec H3/45R 45 degrees multi stub holder for 3 x Ø15mm Hitachi stubs with individual rotation, Ø25x14mm, pin

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EM-Tec HS7 mini M4 cylinder stub dual slot vise clamp, 2x1mm, Ø15x6mm, M4

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EM-Tec S-Clip sample holder with 4xS-Clips at 45° and 4xS-Clip at 90°, 50x10x14mm, pin

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EM-Tec SB140 large capacity clear styrene box for 140 standard 12.7mm pin stubs

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EM-Tec GB-30 TEM grid storage box for 30 TEM grids

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EM-Tec 2A.TI high precision tweezers, style 2A, flat accurate round tips tips, titanium

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Value-Tec set of 5 general purpose tweezers, includes style 3, 5, 5A, 7 and SS (slim long) non-magnetic stainless steel

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EM-Tec 127G.AM SEM pin stub gripper tweezers for Ø12.7mm pin stubs, anti-magnetic stainless steel

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Micro-Tec T5 straight ultra-fine tungsten needle probe, 0.52mm with 0.6µm tip, 25mm

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Value-Tec CS1 carbide tipped scriber, 150mm

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EMR Holey Carbon support film on copper 400 mesh H7 finder grid

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EM-Tec cryo pin for ultramicrotomes, Ø2x10mm, aluminium

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EMR Carbon support film on copper, various hexagonal mesh

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Gilder HH and HHS TEM grids, (extra) fine bar various hexagonal mesh, various materials

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Low profile SEM pin stub Ø12.7 diameter with 90°, aluminium

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Engraved Zeiss pin stub Ø25.4 diameter with 12 numbered fields, short pin, aluminium

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FEI F40 standard brass SEM stage adapter pillar only, 40mmxM6F

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EM-Tec J10P JEOL Ø9.5mm adapter for pin stubs, Ø9.5×9.5mm

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EM-Tec CXS-5N light element and EDS calibration standard, 5 materials plus F/C on pin stub

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EBS TFE (equivalent to Denka 174)

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