产品 – 第14页 – EMSIS ASIA – Electron Microscopy Imaging Company

EM-Tec GR20 bulk sample holder for up to Ø20mm, gilded brass, M4

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EM-Tec CVC1 standard triple grooved/smooth vise jaw, 12x40x6mm

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JEOL Ø9.5×9.5mm angled SEM sample stub with 45 and 90 degree, aluminium

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Denka M3 LaB6 with 60° cone angle 5μm sharp tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30

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EM-Tec SC2R recessed SampleClamp SEM holder, 25x15mm sample area, pin

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EM-Tec SC1 SampleClamp SEM holder, 15x10mm sample area, M4

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EM-Tec RG4 quad geological thin sections top reference holder for 4 petrographic slides up to 48x28mm, M4

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EM-Tec S-Clip sample holder with 2xS-Clips 45°/90° on Ø25.4mm Zeiss pin stub

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EM-Tec AG32 long working time, high conductive silver filled epoxy, 15g in 2 syringes

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EM-Tec 6W.AM precision wafer handling tweezers for Ø6/150mm, anti-magnetic stainless steel”

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EM-Tec 710.CN ESD safe PA66/carbon fibre reinforced tweezers, flat thin tips

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Value-Tec 667.MS industrial strong tweezers, style 667, locking, straight blunt tips, 165mm, magnetic stainless steel

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Micro-Tec NA2 angled fine needle probe 0.25mm, stainless steel, 35mm

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Value-Tec VP4 probe with bend hook tip, round handle, 410 stainless steel

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Micro-Tec disposable carbon steel scalpels #10 with plastic handle, sterile

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EM-Tec S-Clip sample holder with various number S-Clip on Ø63mm Zeiss pin stub

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Copper Target, various sizes Annular on Support Ring, 99.99% Cu

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EMR Lacey Carbon support film on gold, various hexagonal mesh

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DENKA TFE 147C

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SEM pin stub Ø6.4 diameter top, standard pin, aluminium

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Zeiss pin stub Ø12.7 diameter top, short pin, aluminium

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EM-Tec ZJ32 Zeiss pin stub adapter for Ø32mm JEOL stubs

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EM-Tec HJ25 Hitachi M4 adapter for Ø25mm JEOL stubs, M4

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EM-Tec Sn on C resolution standard 7, 10-100nm

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JEOL C-Loop Filaments (6/Box)

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EM-Tec GB16 bulk sample holder for up 16mm, gilded brass, pin

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EM-Tec TV12 mini variable 0-90° angle tilt sample holder 11x12mm, M4

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Hitachi Ø63x6mm M4 cylinder SEM sample stub, aluminium

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JEOL Ø25x16mm cylinder SEM sample stub, aluminium

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EM-Tec PS5 pin stub round clamp up to Ø3.5mm, Ø12.7×7.2mm, pin

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EM-Tec H3/45 45 degrees multi stub holder for 3 x Ø15mm Hitachi stubs, Ø25x14mm, pin

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EM-Tec VS12 compact single action spring-loaded vise holder for up to 12mm, M4

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6 each S-Clip stand-off pillars, 4mm height, M2x3 male/female

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EM-Tec S-Clip sample holder with 2xS-Clips double 90° on Ø25mm JEOL SEM stub

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EM-Tec FIB lift-out grids, Mo, 4 posts

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EM-Tec Carbide cutting tweezers #15AGCI.AM

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Value-Tec 7A.NM general purpose tweezers, style 7A, longer curved fine tips, non-magnetic stainless steel

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Value-Tec 66X.MS industrial strong tweezers, style 66X, strong, reversed tips, blunt tips, 165mm, magnetic stainless steel

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Micro-Tec PS5 probe set with Micro-Tec PV1 probe holder and Micro-Tec C5 carbon steel needle probes (Pkg/10)

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Micro-Tec set with 4 probes (MP1/MP2/MP4/VP5) in plastic pouch, 410 stainless steel

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EMR Formvar Carbon support film on copper 200 mesh F1 finder grid

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JEOL Ø32x12mm angled SEM sample stub with double 90 degree, aluminium

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EM-Tec aperture TEM support grid, various hole sizes and materials

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EM-Tec finder TEM support grids, various mesh-R2, various materials

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Low profile SEM pin stub Ø12.7 diameter with 1mm height, aluminium

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Low profile Zeiss pin stub Ø12.7 diameter with 36° for Zeiss SEM/ FIB systems, short pin, aluminium

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EM-Tec PJ25 pin stub adapter for Ø25mm JEOL and Hitachi stubs

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Hitachi HV35 dovetail stage adapter with M4 screw for Hitachi SU3500, aluminium

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EM-Tec CXS-5C light element and EDS calibration standard, 5 materials plus 200M TEM grid on pin stub

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Denka M3 LaB6 with 90° cone angle 15μm round tip for JEOL

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