产品 – 第14页 – EMSIS ASIA – Electron Microscopy Imaging Company

EM-Tec P45M fixed 45° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x17mm, pin

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EM-Tec V22 compact vise type sample holder for up to 22mm, M4

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EM-Tec P70M EBSD 70° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x20mm, pin

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JEOL Ø50x5mm cylinder SEM sample stub, aluminium

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30 degree angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium

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EM-Tec SC1 SampleClamp SEM holder, 15x10mm sample area, pin

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EM-Tec HS6 mini M4 cylinder stub vise clamp 0-6mm, Ø15x10mm, M4

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EM-Tec R6 top reference holder for 6x Ø25mm/1inch metallographic mounts, M4

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EM-Tec S-Clip sample holder with 10xS-Clips at 90°, 50x10x14mm, Zeiss pin stub

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EM-Tec AG30 long working time, extreme conductive silver filled epoxy, 21g in 2 syringes

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EM-Tec 2W.AM precision wafer handling tweezers for Ø2/51mm, anti-magnetic stainless steel”

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EM-Tec 708.CN ESD safe PA66/carbon fibre reinforced tweezers, sharp angled tips

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Value-Tec 664.MS industrial strong tweezers, style 664, anti-twist, bent serrated pointed tips, 150mm, magnetic stainless steel

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Micro-Tec NS set of straight fine needle probes, stainless steel, 2×0.25mm, 2×0.35mm, 2×0.45mm, 2×0.55mm

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Value-Tec VP2 probe with bend tip, round handle, 410 stainless steel

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Super fine SEM marker pen, black

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EM-Tec S-Clip sample holder with various number S-Clip on Ø50mm Zeiss pin stub

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Chromium Target, various disk sizes, 99.95% Cr

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EMR Lacey Carbon support film on nickel, various square mesh

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MAG*I*CAL traceable TEM calibration standard

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Zeiss pin stub Ø6.4 diameter top, short pin, aluminium

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EM-Tec ZJ12 Zeiss pin stub adapter for Ø12.2mm and Ø9.5mm JEOL stubs

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EM-Tec HS18 Hitachi stub extender assembly with locking nut, M6/M4, 18mm L

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EM-Tec Au on C resolution standard 4, 2-30nm

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Amray AR Loop (std) FiIaments (10/Box)

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EM-Tec VS42 universal spring-loaded large vise holder for up to 42mm, pin

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EM-Tec H45 fixed 45° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x17mm, M4

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Hitachi Ø32x6mm M4 cylinder SEM sample stub, aluminium

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JEOL Ø32x10mm cylinder SEM sample stub, aluminium

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EM-Tec PS11 mini pin stub grid holder for 1 x TEM grid, Ø12.7×3.2mm, pin

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EM-Tec J6 multi stub holder for 6 x Ø12.2mm JEOL stubs, Ø50.0x10mm, pin

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EM-Tec P8 multi pin stub holder for 8 pin stubs, Ø50×10.5mm, M4

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EM-Tec P4 multi pin stub holder for 4 pin stubs, Ø31.5×10.5mm, JEOL 32mm

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EM-Tec S-Clip sample holder with 1xS-Clip 45° on Ø25mm JEOL SEM stub

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EM-Tec FIB lift-out grids, Mo, 3 posts

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EM-Tec 7X.AM high precision reverse tweezers, style 7, very fine curved tips, anti-magnetic stainless steel

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Value-Tec 6.NM general purpose tweezers, style 6, fully bent short tips, non-magnetic stainless steel

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Value-Tec 63X.MS fibre grip strong reversed tweezers, style 63X, straight serrated blunt tips, 165mm, magnetic stainless steel

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Micro-Tec B5 straight fine needle probe 0.55mm, black enameled steel, 35mm

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Micro-Tec MP7 probe with angled hook tip, 410 stainless steel

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Niobium Target, Ø57 x 0.25mm Disc, 99.95% Nb

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EM-Tec S-Clip sample holder with various number S-Clip on Ø50x5mm JEOL SEM stub

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Titanium Target, various disk sizes, 99.6+% Ti

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EM-Tec slotted TEM support grids, various slot sizes, various Materials

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SEM pin stub Ø63 diameter top, standard pin, aluminium

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Engraved Zeiss pin stub Ø12.7 diameter with 4 numbered fields, short pin, aluminium

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FEI F25 short SEM stage adapter set, includes 20mm pillar and 2 locking nuts, M6F

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Hitachi HV20 round SEM stage adapter assembly with M4 screw, compatible with S3500 series, S3000 series and S2000 series SEMs, aluminium/brass

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EM-Tec M-10 calibration standard with 10µm grid pattern

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LaB6 with 90° cone angle 15μm round tip for ISI TEMs

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