产品 – 第9页 – EMSIS ASIA – Electron Microscopy Imaging Company

EM-Tec J25P JEOL Ø25mm adapter for pin stubs, Ø25x10mm

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EM-Tec CXS-5TX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub

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EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin

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EM-Tec F25 FIB grid holder for up to 5 FIB grids, pin

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EM-Tec P45M fixed 45° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x17mm, pin

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JEOL Ø25x8mm cylinder SEM sample stub, aluminium

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Low profile SEM pin stub Ø12.7 diameter with 35° for Tescan FIBxSEM, aluminium

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EM-Tec VC16 grooved vise clamp plate 16x44x5mm incl. set screws

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EM-Tec V80 versatile vise clamp sample holder for up to 80mm, M4

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EM-Tec H3L multi stub holder for 3 x Ø25mm Hitachi stubs, Ø50x6mm, M4

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EM-Tec S-Clip sample holder with 1x S-Clip on Ø19mm Zeiss pin stub

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EM-Tec AG42 strong and highly conductive silver cement, 15g bottle

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EM-Tec 7.AM high precision tweezers, style 7, very fine curved tips, anti-magnetic stainless steel

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EM-Tec 705.CN ESD safe PA66/carbon fibre reinforced tweezers, fine tips

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Value-Tec 610.MS industrial strong tweezers, style 610, straight serrated pointed tips, 150mm, magnetic stainless steel

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Micro-Tec N5 straight fine needle probe 0.55mm, stainless steel, 35mm

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Micro-Tec CPS carbon fibre reinforced PEEK probes, set of all three

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Value-Tec PV4 swivel head wide range pin vise, two dual sided collets, 0.1 to 3.2mm

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EM-Tec S-Clip sample holder with various number S-Clip on Ø32mm Zeiss pin stub

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Gold Target, various disk sizes, 99.99% Au

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EMR Formvar Carbon support film on nickel, various square mesh

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EM-Tec FS21 FIB grid and sample holder for up to 2 FIB grids and Ø12.7mm pin stub, M4

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SEM pin stub Ø25.4 diameter + 4mm extra height, standard pin, aluminium

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Long pin stub adapter with support rim for Hitachi M4 stubs and holders

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Hitachi H4 knurled aluminium locking nut, 4mmxM6

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EM-Tec Au on C resolution standard 2, 30-300nm

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EM-Tec RXS-2WSi resolution and contrast test standard, fused W/Si plus F/C on pin stub

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EM-Tec PS15 Pin stub swivel mount, Ø15x15mm, pin

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EM-Tec R32 bulk sample holder for up to Ø32mm, aluminium, M4

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Hitachi Ø25x6mm M4 cylinder SEM sample stub, aluminium

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JEOL Ø25×12.7mm cylinder SEM sample stub, aluminium

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Denka M3 LaB6 with 60° cone angle 5μm sharp tip for JEOL

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EM-Tec VS12 compact single action spring-loaded vise holder for up to 12mm, pin

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EM-Tec HS15 M4 cylinder stub vise clamp 0-16mm, Ø25x10mm, M4

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EM-Tec J4 multi stub holder for 4 x Ø9.5mm JEOL stubs, Ø31.5x10mm cylinder

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EM-Tec S-Clip sample holder with 2xS-Clips 45°/90° on Ø25 stub, M4

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EM-Tec FIB lift-out grids, Cu, 5 posts

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EM-Tec 5X.AM high precision reverse tweezers, style 5, extra fine straight tips, anti-magnetic stainless steel

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Value-Tec 5.NM general purpose tweezers, style 5, strong fine pointed tips, non-magnetic stainless steel

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Value-Tec 3X.NM general purpose tweezers, style 3X, reversed, pointed tips, non-magnetic stainless steel

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Micro-Tec B3 straight fine needle probe 0.35mm, black enameled steel, 35mm

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Micro-Tec MP4 probe with bend hook tip, 410 stainless steel

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Carbon (Graphite) Target, Ø19 x 1.5mm Disc, 99.99% C

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EM-Tec S-Clip sample holder with various number S-Clip on Ø25x10mm JEOL SEM stub

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Platinum Target, various sizes Annular on Support Ring, 99.99% Pt

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EM-Tec TEM square mesh support grids, various Mesh, various Materials

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SEM pin stub Ø38 diameter top, standard pin, aluminium

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Zeiss pin stub Ø100 diameter top, short pin, aluminium

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EM-Tec short brass SEM stage adapter pillar only, for FEI with M4 screw, 20mmxM6F

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EM-Tec HJ50 Hitachi M4 adapter for Ø50mm JEOL stubs, M4

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