产品 – 第9页 – EMSIS ASIA – Electron Microscopy Imaging Company

EM-Tec P72 EBSD 70° pre-tilt sample holder for Ø30mm / Ø32mm / Ø1-1/4inch mounts, pin

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EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin

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JEOL Ø12.2x5mm cylinder SEM sample stub, aluminium

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EM-Tec multi stub preparation stand for 38 pin stubs

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EM-Tec VC12 standard vise clamp plate 12x44x5mm incl. set screws

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EM-Tec TG4 TEM grid holder securely holds up to 4 TEM grids, Ø18×3.2mm, pin

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EM-Tec R4 top reference holder for 4x Ø30mm/1-1/4inch metallographic mounts, M4

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Ø32x5mm spacer discs for EM-Tec reference holder

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EM-Tec C33 fast drying conductive carbon paint, 15g bottle

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EM-Tec 5B.AM high precision tweezers, style 5B, extra fine bent tips, anti-magnetic stainless steel

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EM-Tec 707A.CT ESD safe PVDF/carbon fibre reinforced tweezers, sharp curved tips

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Value-Tec 305.MS, 12inch steam forceps with PVC covered tips, 305mm, magnetic stainless steel

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Micro-Tec N3 straight fine needle probe 0.35mm, stainless steel, 35mm

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Micro-Tec CP2 carbon fibre reinforced PEEK probe, curved pointed / strong

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Value-Tec PV3 sliding collet pin vise, 0.1 to 1.2mm

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EM-Tec S-Clip sample holder with various number S-Clip on Ø100mm pin stub

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Gold/Palladium Target, various disk sizes, Au/Pd 60/40, 99.99% Au/Pd

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EMR Carbon support film on nickel, various square mesh

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EM-Tec FS21 FIB grid and sample holder for up to 2 FIB grids and Ø12.7mm pin stub, pin

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Engraved SEM pin stub Ø19.0 diameter with 4 numbered fields, aluminium

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45 degree angled Zeiss pin stub Ø12.7 diameter, short pin, aluminium

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EM-Tec FV44 versatile SEM stage adapter assembly for FEI/Philips with M4 screw, M6Fx40mm

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JEOL 12P JEOL Ø12.2mm adapter for pin stubs, Ø12.2x10mm

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EM-Tec CXS-5LE light element and EDS calibration standard, 5 materials plus F/C on pin stub

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EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub

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EM-Tec V22 compact vise type sample holder for up to 22mm, pin

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EM-Tec M26 metallographic mount holder for 25mm / 1inch mounts, M4

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In-lens SEM mount type 4 for Hitachi SU9000, S-5500, S-5200 and S-5000

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JEOL Ø12.2x10mm angled SEM sample stub with 45 and 90 degree, aluminium

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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for FEI, Philips, Amray

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EM-Tec P8 multi pin stub holder for 8 pin stubs, Ø50×10.5mm, pin

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EM-Tec J3 multi stub holder for 3 x Ø12.2mm JEOL stubs, Ø31.5x10mm, M4

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EM-Tec JS12 cylinder stub vise clamp 0-12mm, JEOL Ø25x10mm

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EM-Tec S-Clip sample holder with 10xS-Clips at 90°, 50x10x14mm, M4

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EM-Tec FIB lift-out grids, Cu, 2 posts

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EM-Tec 3X.AM high precision reverse tweezers, style 3, very sharp fine tips, anti-magnetic stainless steel

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Value-Tec 3C.NM general purpose tweezers, style 3C, shorter, fine strong pointed tips, non-magnetic stainless steel

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Value-Tec 82.MS fibre grip strong slim tweezers, style 82, serrated blunt tips, 200mm, magnetic stainless steel

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Micro-Tec PS3 probe set with Micro-Tec PV1 probe holder and Micro-Tec BS set of 8 fine pointed straight black enameled steel needle probes

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Micro-Tec MP1 probe with straight tip, 410 stainless steel

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Micro-Tec disposable carbon steel scalpels set with plastic handle contains 2x #10/11/15/20/22, sterile

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EM-Tec S-Clip sample holder with various number S-Clip on Ø63x6mm stub, M4

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Platinum/Palladium Target, various disk sizes, Pt/Pd 80/20, 99.99% Pt/Pd

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Gilder slotted TEM grids, various slot sizes, various materials

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SEM Dish pin stub, Ø12.7x7mm with 1.5mm dish depth, aluminium

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EM-Tec Z4 Zeiss pin stub to Hitachi M4 adapter , straight for smaller stubs/holders

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EM-Tec HJ12 Hitachi M4 adapter for Ø12.2mm JEOL or ISI stubs, Ø15x10mm, M4

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EM-Tec US6 universal SEM specimen stub adapter set

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AEI/Cambridge V-Loop Filaments (10/Box)

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EM-Tec M40 metallographic mount holder for 40mm / 1-1/2inch mounts, pin

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