产品 – 第5页 – EMSIS ASIA – Electron Microscopy Imaging Company

SEM pin stub Ø9.5 diameter top, standard pin, aluminium

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Zeiss pin stub Ø19 diameter top, short pin, aluminium

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EM-Tec ZJ50 Zeiss pin stub adapter for Ø50mm JEOL stubs

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EM-Tec HJ32 Hitachi M4 adapter for Ø32mm JEOL stubs, M4

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EM-Tec MCS-1CF certified calibration standard, 2.5mm to 1µm

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Hitachi Cartridge (Desktop) (10/Box)

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EM-Tec B26 bulk sample holder for up 26mm, aluminium, pin

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EM-Tec TV25 variable 0-90° angle tilt holder for stubs up Ø38mm, M4

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Hitachi Ø100×4.5mm M4 cylinder SEM sample stub, aluminium

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JEOL Ø25x16mm angled SEM sample stub with 45 and 90 degree, aluminium

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EM-Tec PS14 mini pin stub grid holder for 4 x TEM grids, Ø12.7×3.2mm, pin

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EM-Tec P3/45 multi pin stub holder 45° for 3 pin stubs, Ø25x14mm, pin

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EM-Tec HS16 M4 cylinder stub round clamp up to Ø16mm, Ø25x10mm, M4

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EM-Tec S-Clip swivel mount sample holder with 1xS-Clip, pin

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EM-Tec SB77 large capacity wooden box for 77 standard 12.7mm pin stubs

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EM-Tec GB-4 cryo grid box for 4 TEM grids

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EM-Tec 1.TI high precision tweezers, style 1, strong fine tips, titanium

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Value-Tec F.NM general purpose tweezers, style F, bent fine pointed tips, non-magnetic stainless steel

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Value-Tec 7X.NM general purpose tweezers, style 7X, reversed curved fine tips, non-magnetic stainless steel

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Micro-Tec C5 straight fine needle probe 0.40mm, nickel plated carbon tool steel, 28mm

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Micro-Tec set with 6 probes (MP1/MP2/MP4/MP5/ZMP7/MP8) in plastic pouch, 410 stainless steel

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EMR Holey Carbon support film on copper 200 mesh F1 finder grid

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JEOL Ø32x12mm angled SEM sample stub with 45 and 90 degree, aluminium

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Gilder TEM grid, standard, various square mesh, various materials

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Gilder GA TEM aperture grid, various hole sizes and various material

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Engraved SEM pin stub Ø12.7 diameter with 4 numbered fields, aluminium

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Engraved Zeiss pin stub Ø19.0 diameter with 4 numbered fields, short pin, aluminium

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EM-Tec PJ32 pin stub adapter for Ø32mm JEOL and Hitachi stubs

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Hitachi HV37 dovetail stage adapter with M4 screw for Hitachi S-3700N, aluminium/brass

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EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub

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Denka M3 LaB6 with 90° cone angle 15μm tip for Zeiss, Tescan

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EM-Tec G2 twin geological thin sections holder for 2 petrographic slides up to 47x27mm, pin

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EM-Tec F25 FIB grid holder for up to 5 FIB grids, M4

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Hitachi Ø25x16mm M4 angled SEM sample stub, 45 and 90 degree, aluminium

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EM-Tec multi stub preparation stand for 28 JEOL 9.5mm stubs

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EM-Tec PS12 pin stub vise clamp 0-12mm, Ø25×7.2mm, pin

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EM-Tec RG2 twin geological thin sections top reference holder for 2 petrographic slides up to 48x28mm, pin

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EM-Tec P6/45 multi pin stub holder 45° for 6 pin stubs, Ø35x14mm, M4

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Phenom PH22 bulk holder up to Ø22x12mm for Phenom metallurgical sample holder

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EM-Tec single sided conductive aluminium SEM tape 10mm x 33m

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EM-Tec 3C.AM high precision tweezers, style 3C, short, very sharp fine tips, anti-magnetic stainless steel

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EM-Tec 708.CT ESD safe PVDF/carbon fibre reinforced tweezers, sharp angled tips

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Value-Tec 126.MS industrial strong tweezers, style 126, 45 degree blunt tips, 123mm, magnetic stainless steel

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Micro-Tec PV5 long probe holder for probe diameters 0.1-0.65mm, stainless steel, 152mm

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Micro-Tec GN3 glass fibre reinforced polyamide66 probe, sharp flat / large flat

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Value-Tec CB2 stainless steel cleaning basket, 55m

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EM-Tec S-Clip sample holder with various number S-Clip on Ø38mm pin stub

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Silver Target, various disc sizes, 99.97% Ag

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EMR Lacey Carbon support film on coppe, various square mesh

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EM-Tec TC3 TEM EDX calibration standard Cu foil on Al grid

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