产品 – 第3页 – EMSIS ASIA – Electron Microscopy Imaging Company

Micro-Tec NA5 angled fine needle probe 0.55mm, stainless steel, 35mm

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Micro-Tec NAS set of angled fine needle probes, stainless steel, 2×0.25mm, 2×0.35mm, 2×0.45mm, 2×0.55mm

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Value-Tec G4P 4-prong pick-up tool, 116mm

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Value-Tec 63X.MS fibre grip strong reversed tweezers, style 63X, straight serrated blunt tips, 165mm, magnetic stainless steel

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Value-Tec 67X.MS fibre grip strong reversed tweezers, style 67X, bent serrated blunt tips, 165mm, magnetic stainless steel

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Value-Tec double loop pick-up tool, 116mm

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JEOL Ø25x5mm cylinder SEM sample stub, aluminium

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SEM pin stub Ø12.7 diameter top, standard pin, brass

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Micro-Tec CT1 carbon fibre reinforced PVDF probe, fine pointed / strong flat

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Micro-Tec CT2 carbon fibre reinforced PVDF probe, curved pointed / strong flat

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Micro-Tec CT3 carbon fibre reinforced PVDF probe, sharp flat / large flat

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Micro-Tec GN1 glass fibre reinforced polyamide66 probe, fine pointed / strong flat

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Micro-Tec disposable carbon steel scalpels #10 with plastic handle, sterile

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Micro-Tec GN2 glass fibre reinforced polyamide66 probe, curved pointed / strong flat

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Micro-Tec disposable carbon steel scalpels #11 with plastic handle, sterile

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Micro-Tec GN3 glass fibre reinforced polyamide66 probe, sharp flat / large flat

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Micro-Tec disposable carbon steel scalpels #15 with plastic handle, sterile

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Micro-Tec disposable carbon steel scalpels #20 with plastic handle, sterile

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Micro-Tec disposable carbon steel scalpels #22 with plastic handle, sterile

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Engraved SEM pin stub Ø25.4 diameter with 12 numbered fields, aluminium

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Double 90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium

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Zeiss pin stub Ø6.4 diameter top, short pin, aluminium

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45/90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium

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SEM pin stub Ø6.4 diameter top, standard pin, aluminium

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Hitachi Ø25x16mm M4 angled SEM sample stub, double 90 degree, aluminium

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Hitachi Ø25x16mm M4 angled SEM sample stub, 45 and 90 degree, aluminium

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Engraved Zeiss pin stub Ø25.4 diameter with 12 numbered fields, short pin, aluminium

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Double 90 degree angled SEM pin stub Ø25.4 diameter standard pin, aluminium

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45/90 degree angled SEM pin stub Ø25.4 diameter standard pin, aluminium

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6 each S-Clip stand-off pillars, 4mm height, M2x3 male/female

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Value-Tec 82.MS fibre grip strong slim tweezers, style 82, serrated blunt tips, 200mm, magnetic stainless steel

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EM-Tec 702A.CT ESD safe PVDF/carbon fibre reinforced tweezers, blunt tips

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EM-Tec 705.CT ESD safe PVDF/carbon fibre reinforced tweezers, fine tips

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EM-Tec 707.CT ESD safe PVDF/carbon fibre reinforced tweezers, sharp tips

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EM-Tec 708.CT ESD safe PVDF/carbon fibre reinforced tweezers, sharp angled tips

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EM-Tec 709.CT ESD safe PVDF/carbon fibre reinforced tweezers, flat tips

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EM-Tec 710.CT ESD safe PVDF/carbon fibre reinforced tweezers, flat thin tips

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EM-Tec 707A.CT ESD safe PVDF/carbon fibre reinforced tweezers, sharp curved tips

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Zeiss pin stub Ø50 diameter top, short pin, aluminium

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Hitachi Ø15x11mm M4 angled SEM sample stub, 45 and 90 degree, aluminium

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Value-Tec PV4 swivel head wide range pin vise, two dual sided collets, 0.1 to 3.2mm

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SEM pin stub Ø50 diameter top, standard pin, aluminium

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Micro-Tec PV1 precision probe holder for probe diameters 0.1-0.65mm, brass/steel, 95mm

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Value-Tec 305.MS, 12inch steam forceps with PVC covered tips, 305mm, magnetic stainless steel

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Double 45/90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium

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Double 45/90 degree angled SEM pin stub Ø25.4 diameter standard pin, aluminium

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Hitachi Ø25x8mm M4 angled SEM sample stub, double 45/90 degree, aluminium

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Micro-Tec disposable carbon steel scalpels set with plastic handle contains 2x #10/11/15/20/22, sterile

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Value-Tec M7 mini needle probes 0.70mm with handle, stainless steel, 63mm

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SEM pin stub Ø12.7 diameter top, with flat, standard pin, aluminium

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