产品 – 第2页 – EMSIS ASIA – Electron Microscopy Imaging Company

Low profile SEM pin stub Ø12.7 diameter with 1mm height, aluminium

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Low profile Zeiss pin stub Ø12.7 diameter with 36° for Zeiss SEM/ FIB systems, short pin, aluminium

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EM-Tec PJ25 pin stub adapter for Ø25mm JEOL and Hitachi stubs

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Hitachi HV35 dovetail stage adapter with M4 screw for Hitachi SU3500, aluminium

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EM-Tec CXS-5C light element and EDS calibration standard, 5 materials plus 200M TEM grid on pin stub

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Denka M3 LaB6 with 90° cone angle 15μm round tip for JEOL

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EM-Tec G1 single geological thin section holder for one petrographic slide up to 47x27mm, pin

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EM-Tec H70 EBSD 70° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x20mm, M4

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Hitachi Ø25x16mm M4 angled SEM sample stub, double 90 degree, aluminium

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EM-Tec multi stub preparation stand for 23 pin stubs

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EM-Tec M31P Metal slide adapter to accommodate pin stubs on reflected light microscopes

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EM-Tec R6 top reference holder for 6x Ø25mm/1inch metallographic mounts, pin

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EM-Tec H3/45R 45 degrees multi stub holder for 3 x Ø15mm Hitachi stubs with individual rotation, Ø25x14mm, M4

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Phenom PHF32 filter holder kit with support block and clamp ring for Phenom metallurgical sample holder

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EM-Tec single sided conductive aluminium SEM tape 6mm x 33m

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EM-Tec 3.AM high precision tweezers, style 3, very sharp fine tips, anti-magnetic stainless steel

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EM-Tec 707.CT ESD safe PVDF/carbon fibre reinforced tweezers, sharp tips

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Value-Tec 127.MS industrial strong tweezers, style 127, smooth flat long tips, 115mm, magnetic stainless steel

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Micro-Tec PV1 precision probe holder for probe diameters 0.1-0.65mm, brass/steel, 95mm

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Micro-Tec GN2 glass fibre reinforced polyamide66 probe, curved pointed / strong flat

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Value-Tec DB3 long tip air blower / hand duster

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EM-Tec S-Clip sample holder with various number S-Clip on Ø32mm pin stub

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EM-Tec staggered slotted mesh TEM support grids, 75/300 mesh, various materials

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EMR Holey Carbon support film on copper, various square mesh

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EM-Tec TC2 TEM calibration standard evaporated Al film

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45/90 degree angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium

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EM-Tec GZM4 compact Zeiss pin stub adapter with M4 thread, gold plated brass, short Zeiss pin

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EM-Tec HS4 M4 adapter for Cambridge S4 stubs, M4

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EM-Tec JV60 versatile dovetail SEM stage adapter with M4 screw for JEOL SEMs 6610, 6490, 6480, 6460, 5910, 5900, 5800 and JIB 4500 FIB/SEM

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EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on pin stub

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EM-Tec GS10 swivel head sample holder for up 10mm, gold plated brass, pin

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EM-Tec VS42 universal spring-loaded large vise holder for up to 42mm, M4

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EM-Tec CVC2 single large 120 degrees groove vise jaw, 12x40x6mm

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JEOL Ø9.5×9.5mm cylinder SEM sample stub, aluminium

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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30

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EM-Tec J4 multi stub holder for 4 x Ø9.5mm JEOL stubs, Ø31.5x10mm, pin

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EM-Tec SC2 SampleClamp SEM holder, 25x15mm sample area, M4

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EM-Tec ST1 STEM imaging holder for TEM/FIB grids, M4

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EM-Tec S-Clip sample holder with 2xS-Clips double 90° on Ø25.4mm Zeiss pin stub

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EM-Tec AG20 conductive silver pen with 0.8mm microtip

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EM-Tec 8W.AM precision wafer handling tweezers for Ø8/200mm, anti-magnetic stainless steel”

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EM-Tec 707A.CN ESD safe PA66/carbon fibre reinforced tweezers, sharp curved tips

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Value-Tec 682.MS industrial strong tweezers, style 682, straight smooth pointed tips, 178mm, magnetic stainless steel

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Micro-Tec NA3 angled fine needle probe 0.35mm, stainless steel, 35mm

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Value-Tec VP5 probe with curved hook tip, round handle, 410 stainless steel

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Micro-Tec disposable carbon steel scalpels #11 with plastic handle, sterile

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EM-Tec S-Clip sample holder with various number S-Clip on Ø100mm Zeiss pin stub

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Iridium Target, various disk sizes, 99.99% Ir

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EMR Carbon support film on gold, various square mesh

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Hitachi HV50 dovetail stage adapter with M4 screw for Hitachi SU5000, aluminium (Copy)

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