产品 – 第16页 – EMSIS ASIA – Electron Microscopy Imaging Company

EM-Tec R51 bulk sample holder for up to Ø51mm, aluminium, pin

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EM-Tec H72 EBSD 70° pre-tilt sample holder for Ø30mm/1-1/4inch mounts, M4

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Hitachi Ø32x12mm M4 angled SEM sample stub, 45 and 90 degree, aluminium

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EM-Tec PrepPod stand for SEM pin stubs

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Hitachi H25 tall height extension pillar only, 25mmxM6

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EM-Tec H3L multi stub holder for 3 x Ø25mm Hitachi stubs, Ø50x6mm, pin

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EM-Tec H3/45 45 degrees multi stub holder for 3 x Ø15mm Hitachi stubs, Ø25x14mm, M4

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EM-Tec S-Clip sample holder with 2xS-Clips double 90° on Ø25.4mm pin stub

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Double sided conductive copper SEM tape 12mm x 33m

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EM-Tec 2.AM high precision tweezers, style 2, flat, sharp fine tips, anti-magnetic stainless steel

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EM-Tec 702A.CT ESD safe PVDF/carbon fibre reinforced tweezers, blunt tips

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Value-Tec set of 6 larger industrial strong tweezers, includes style 110/510/66X/667/682/686, magnetic stainless steel

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EM-Tec 250.AM SEM stub gripper tweezers for Ø25mm cylinder stubs, anti-magnetic stainless steel

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Micro-Tec CTS carbon fibre reinforced PVDF probes, set of all three

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Value-Tec P25B flat nose pliers with brass lined jaws

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Double 90 degree angled SEM pin stub Ø32mm diameter, standard pin, aluminium

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Gilder G200TH TEM grid, thicker 200 square mesh, various materials

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EMR Formvar support film on copper, various square mesh

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EM-Tec TS3 TEM combined test specimen standard

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45 degree angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium

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45/90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium

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FEI F55 tall SEM stage adapter set, includes 50mm pillar, base and 2 locking nuts, M6F

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EM-Tec JV40 versatile SEM stage adapter with M4 screw for JEOL Neoscope JCM6000 and JCM5000

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EM-Tec CXS-6BE BSD calibration standard, materials plus F/C on pin stub

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EM-Tec P70 EBSD 70° pre-tilt holder for pin stubs/holders, Ø12.7x20mm, pin

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EM-Tec CV1 centering vise SEM sample holder for up to 110mm, M4

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EM-Tec CVE1 extension plates 22.5x40x5mm extends CV1 up to 155mm

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JEOL Ø9.5×9.5mm angled SEM sample stub with 45 degree, aluminium

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EMR Holey Carbon support film on nickel, copper or gold on various hexagonal mesh

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EM-Tec SC2 SampleClamp SEM holder, 25x15mm sample area, pin

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EM-Tec HS10 M4 cylinder stub round clamp up to Ø10mm, Ø15x10mm, M4

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EM-Tec RG2 twin geological thin sections top reference holder for 2 petrographic slides up to 48x28mm, M4

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EM-Tec S-Clip sample holder with 1xS-Clip 45° on Ø25.4mm Zeiss pin stub

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EM-Tec AG31 short working time, conductive silver filled epoxy, 14g in 2 syringes

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EM-Tec 4W.AM precision wafer handling tweezers for Ø4/100mm, anti-magnetic stainless steel”

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EM-Tec 709.CN ESD safe PA66/carbon fibre reinforced tweezers, flat tips

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Value-Tec 660.MS industrial strong tweezers, style 660, bent serrated pointed tips, 150mm, magnetic stainless steel

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Micro-Tec PS2 probe set with Micro-Tec PV1 probe holder and Micro-Tec NAS set of 8 fine pointed angled stainless steel needle probes

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Value-Tec VP3 probe with slight curved tip, round handle, 410 stainless steel

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Value-Tec stainless steel crucible tongs, 258mm

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45/90 degree angled SEM pin stub Ø32mm diameter, standard pin, aluminium

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Copper Target, various disk sizes, 99.99% Cu

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EMR Holey Carbon support film on gold, various hexagonal mesh

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DENKA TFE 174

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