产品 – 第12页 – EMSIS ASIA – Electron Microscopy Imaging Company

EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si plus F/C on pin stub

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EM-Tec GR20 bulk sample holder for up to Ø20mm, gilded brass, pin

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EM-Tec M40 metallographic mount holder for 40mm / 1-1/2inch mounts, M4

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Hitachi Ø25x8mm M4 angled SEM sample stub, double 45/90 degree, aluminium

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JEOL Ø25x16mm angled SEM sample stub with 45 degree, aluminium

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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for JEOL

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EM-Tec P29 multi pin stub holder for 29 pin stubs, Ø90x7mm, pin

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EM-Tec P6 multi pin stub holder for 6 pin stubs, Ø43×10.5mm, M4

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EM-Tec J3 multi stub holder for 3 x Ø12.2mm JEOL stubs, Ø31.5x10mm cylinder

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EM-Tec S-Clip sample holder with 2xS-Clips double 90° on Ø25mm stub, M4

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EM-Tec FIB lift-out grids, Mo, 2 posts

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EM-Tec 5ACX.AM high precision reverse anti-capillary tweezers, style 5ACX, extra fine tips, anti-magnetic stainless steel

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Value-Tec 5A.NM general purpose tweezers, style 5A, off-set finepointed tips, non-magnetic stainless steel

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Value-Tec 5X.NM general purpose tweezers, style 5X, reversed, fine pointed tips, non-magnetic stainless steel

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Micro-Tec B4 straight fine needle probe 0.45mm, black enameled steel, 35mm

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Micro-Tec MP5 probe with curved hook tip, 410 stainless steel

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Molydenum Target, Ø57 x 0.25mm Disc, 99.95% Mo

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EM-Tec S-Clip sample holder with various number S-Clip on Ø32x10mm JEOL SEM stub

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Tantalum Target, various disk sizes, 99.95% Ta

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EM-Tec slotted mesh TEM support grids, various Mesh, various MaterialsCopper

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SEM pin stub Ø50 diameter top, standard pin, aluminium

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Low profile Zeiss pin stub Ø12.7 diameter with 1mm height, short pin, aluminium

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EM-Tec FV24 versatile SEM stage adapter assembly for FEI/Philips with M4 screw, M6Fx20mm

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Hitachi TM30 stage adapter kit assembly, compatible with TM33030plus, TM303, TM3000 and TM1000 table top SEMs

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EM-Tec M-1 calibration standard with 1µm grid pattern

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LaB6 with 90° cone angle 15μm round tip for ISI, ABT, Topcon SEM

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EM-Tec M51 metallographic mount holder for 50mm / 2inch mounts, pin

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EM-Tec H71 EBSD 70° pre-tilt sample holder for Ø25mm/1inch mounts, M4

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Hitachi Ø32x12mm M4 angled SEM sample stub, double 90 degree, aluminium

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EM-Tec multi stub preparation stand for 8 JEOL or Hitachi Ø25mm stubs

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EM-Tec HJ11 Hitachi M4 adapter for Ø12.2mm JEOL stubs, Ø15x10mm, M4

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EM-Tec H3 multi stub holder for 3 x Ø15mm Hitachi stubs, Ø25x6mm, pin

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EM-Tec H6/45R 45 degrees multi stub holder for 6 x Ø15mm Hitachi stubs with individual rotation, Ø35x14mm, M4

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EM-Tec S-Clip sample holder with 2xS-Clips 45°/90° on Ø25.4mm pin stub

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Double sided conductive copper SEM tape 6mm x 16.4m

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EM-Tec 1.AM high precision tweezers, style 1, strong fine tips, anti-magnetic stainless steel

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EM-Tec SET.TI high precision tweezers set style 1/2A/3C/5/7 in plastic wallet with hard foam, titanium

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Value-Tec set of 5 medium industrial strong tweezers, includes styles 110/127/610/660/66X, magnetic stainless steel

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EM-Tec 150.AM SEM stub gripper tweezers for Ø15mm cylinder stubs, anti-magnetic stainless steel

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Micro-Tec CT3 carbon fibre reinforced PVDF probe, sharp flat / large flat

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Value-Tec flat nose pliers with brass lined jaws

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EM-Tec dual layer graphene TEM support film on 2000 fine aperture mesh copper grids

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Gilder G200TT TEM grid, thick/thin bar 200 square mesh, various materials

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EMR Carbon support film on copper, various square mesh

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EM-Tec TS2 TEM test standard evaporated Pt/Ir

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45/90 degree angled high profile SEM pin stub Ø12.7 diameter standard pin, aluminium

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Double 90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium

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EM-Tec FV54 versatile SEM stage adapter assembly for FEI/Philips with M4 screw, M6Fx50mm

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EM-Tec JV35 versatile dovetail SEM stage adapter with M4 screw for JEOL SEMs 35, 35C, 35CF, 50, 820,840, 880 and JXA 733 microprobe

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EM-Tec CXS-6LE light element and EDS calibration standard, 6 materials plus F/C on pin stub

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