产品 – 第10页 – EMSIS ASIA – Electron Microscopy Imaging Company

EM-Tec SC2R recessed SampleClamp SEM holder, 25x15mm sample area, pin

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EM-Tec H6/45 45 degrees multi stub holder for 6 x Ø15mm Hitachi stubs, Ø35x14mm, pin

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EM-Tec J4 multi stub holder for 4 x Ø9.5mm JEOL stubs, Ø31.5x10mm, pin

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EM-Tec J3 multi stub holder for 3 x Ø12.2mm JEOL stubs, Ø31.5x10mm, pin

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EM-Tec P4 multi pin stub holder for 4 pin stubs, Ø31.5×10.5mm, pin

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Hitachi H25 tall height extension pillar only, 25mmxM6

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Phenom PHA32 adapter ring to hold 25mm/1 inch diameter mounts in the Phenom metallurgical holder

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EM-Tec M31P Metal slide adapter to accommodate pin stubs on reflected light microscopes

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EM-Tec PS12 pin stub vise clamp 0-12mm, Ø25×7.2mm, pin

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EM-Tec PS16 pin stub round clamp up to Ø16mm, Ø25×7.2mm, pin

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EM-Tec PS11 mini pin stub grid holder for 1 x TEM grid, Ø12.7×3.2mm, pin

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EM-Tec V80 versatile vise clamp sample holder for up to 80mm, pin

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EM-Tec PS3 mini pin stub SampleClamp 0-2mm, Ø12.7mm, pin

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EM-Tec VC12 standard vise clamp plate 12x44x5mm incl. set screws

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EM-Tec PS5 pin stub round clamp up to Ø3.5mm, Ø12.7×7.2mm, pin

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EM-Tec V120 versatile vise clamp sample holder for up to 120mm, pin

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EM-Tec PS14 mini pin stub grid holder for 4 x TEM grids, Ø12.7×3.2mm, pin

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EM-Tec VC16 grooved vise clamp plate 16x44x5mm incl. set screws

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EM-Tec PS8 pin stub round clamp up to Ø6mm, Ø12.7×7.2mm, pin

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EM-Tec PS6 mini split pin stub vise clamp 0-6mm, Ø12.7×7.2mm, pin

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EM-Tec P35 fixed 35°pre-tilt holder for Tescan FIB systems, Ø12.7x17mm, pin

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EM-Tec PS4 mini pin stub vise clamp 0-4mm, Ø12.7×7.2mm, pin

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EM-Tec PS7 mini pin stub dual slot vise clamp, 2x1mm, Ø15x6mm, pin

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FEI F50 long brass SEM stage adapter pillar only, 50mmxM6F

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EM-Tec HJ11 Hitachi M4 adapter for Ø12.2mm JEOL stubs, Ø15x10mm, M4

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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for JEOL

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Denka M3 LaB6 with 60° cone angle 5μm sharp tip for JEOL

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Denka M3 LaB6 with 90° cone angle 20μm flat tip for FEI, Philips, Amray

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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for FEI, Philips, Amray

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Denka M3 LaB6 with 60° cone angle 5μm sharp tip for FEI, Philips, Amray

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Denka M3 LaB6 with Hitachi S-Type base, 60° cone angle, 10 μm sharp tip for S-, SU, H- and X-Series SEM and TEM

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Denka M3 LaB6 with Hitachi S-Type base, 60° cone angle, 5 μm sharp tip for S-, SU, H- and X-Series SEM and TEM

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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30

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Denka M3 LaB6 with 60° cone angle 5μm sharp tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30

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EMR Holey Carbon support film on nickel, copper or gold on various hexagonal mesh

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30 degree angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium

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70 degree EBSD angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium

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Low profile SEM pin stub Ø12.7 diameter with 35° for Tescan FIBxSEM, aluminium

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SEM pin stub Ø12.7 diameter top, standard pin, brass

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EM-Tec multi stub preparation stand for 23 pin stubs

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EM-Tec multi stub preparation stand for 28 JEOL 9.5mm stubs

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EM-Tec multi stub preparation stand for 28 JEOL 12.2mm stubs

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EM-Tec multi stub preparation stand for 28 Hitachi Ø15mm stubs

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EM-Tec multi stub preparation stand for 38 pin stubs

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EM-Tec PrepPod stand for SEM pin stubs

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EM-Tec multi-angle PrepPod stand for SEM pin stubs

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ISI/ABT/Topcon Ø15x10mm SEM cylinder sample stub, aluminium

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EM-Tec multi stub preparation stand for 6 JEOL or Hitachi Ø32mm stubs

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EM-Tec multi stub preparation stand for 8 JEOL or Hitachi Ø25mm stubs

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JEOL Ø25x16mm angled SEM sample stub with 45 and 90 degree, aluminium

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