产品 – EMSIS ASIA – Electron Microscopy Imaging Company

45/90 degree angled high profile SEM pin stub Ø12.7 diameter standard pin, aluminium

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Double 90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium

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EM-Tec FV54 versatile SEM stage adapter assembly for FEI/Philips with M4 screw, M6Fx50mm

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EM-Tec JV35 versatile dovetail SEM stage adapter with M4 screw for JEOL SEMs 35, 35C, 35CF, 50, 820,840, 880 and JXA 733 microprobe

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EM-Tec CXS-6LE light element and EDS calibration standard, 6 materials plus F/C on pin stub

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EM-Tec P45M fixed 45° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x17mm, pin

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EM-Tec V22 compact vise type sample holder for up to 22mm, M4

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EM-Tec P70M EBSD 70° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x20mm, pin

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JEOL Ø50x5mm cylinder SEM sample stub, aluminium

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30 degree angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium

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EM-Tec SC1 SampleClamp SEM holder, 15x10mm sample area, pin

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EM-Tec HS6 mini M4 cylinder stub vise clamp 0-6mm, Ø15x10mm, M4

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EM-Tec R6 top reference holder for 6x Ø25mm/1inch metallographic mounts, M4

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EM-Tec S-Clip sample holder with 10xS-Clips at 90°, 50x10x14mm, Zeiss pin stub

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EM-Tec AG30 long working time, extreme conductive silver filled epoxy, 21g in 2 syringes

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EM-Tec 2W.AM precision wafer handling tweezers for Ø2/51mm, anti-magnetic stainless steel”

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EM-Tec 708.CN ESD safe PA66/carbon fibre reinforced tweezers, sharp angled tips

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Value-Tec 664.MS industrial strong tweezers, style 664, anti-twist, bent serrated pointed tips, 150mm, magnetic stainless steel

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Micro-Tec NS set of straight fine needle probes, stainless steel, 2×0.25mm, 2×0.35mm, 2×0.45mm, 2×0.55mm

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Value-Tec VP2 probe with bend tip, round handle, 410 stainless steel

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Super fine SEM marker pen, black

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EM-Tec S-Clip sample holder with various number S-Clip on Ø50mm Zeiss pin stub

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Chromium Target, various disk sizes, 99.95% Cr

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EMR Lacey Carbon support film on nickel, various square mesh

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MAG*I*CAL traceable TEM calibration standard

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Zeiss pin stub Ø6.4 diameter top, short pin, aluminium

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EM-Tec ZJ12 Zeiss pin stub adapter for Ø12.2mm and Ø9.5mm JEOL stubs

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EM-Tec HS18 Hitachi stub extender assembly with locking nut, M6/M4, 18mm L

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EM-Tec Au on C resolution standard 4, 2-30nm

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Amray AR Loop (std) FiIaments (10/Box)

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EM-Tec VS42 universal spring-loaded large vise holder for up to 42mm, pin

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EM-Tec H45 fixed 45° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x17mm, M4

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Hitachi Ø32x6mm M4 cylinder SEM sample stub, aluminium

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JEOL Ø32x10mm cylinder SEM sample stub, aluminium

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EM-Tec PS11 mini pin stub grid holder for 1 x TEM grid, Ø12.7×3.2mm, pin

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EM-Tec J6 multi stub holder for 6 x Ø12.2mm JEOL stubs, Ø50.0x10mm, pin

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EM-Tec P8 multi pin stub holder for 8 pin stubs, Ø50×10.5mm, M4

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EM-Tec P4 multi pin stub holder for 4 pin stubs, Ø31.5×10.5mm, JEOL 32mm

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EM-Tec S-Clip sample holder with 1xS-Clip 45° on Ø25mm JEOL SEM stub

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EM-Tec FIB lift-out grids, Mo, 3 posts

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EM-Tec 7X.AM high precision reverse tweezers, style 7, very fine curved tips, anti-magnetic stainless steel

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Value-Tec 6.NM general purpose tweezers, style 6, fully bent short tips, non-magnetic stainless steel

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Value-Tec 63X.MS fibre grip strong reversed tweezers, style 63X, straight serrated blunt tips, 165mm, magnetic stainless steel

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Micro-Tec B5 straight fine needle probe 0.55mm, black enameled steel, 35mm

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Micro-Tec MP7 probe with angled hook tip, 410 stainless steel

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Niobium Target, Ø57 x 0.25mm Disc, 99.95% Nb

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EM-Tec S-Clip sample holder with various number S-Clip on Ø50x5mm JEOL SEM stub

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Titanium Target, various disk sizes, 99.6+% Ti

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EM-Tec slotted TEM support grids, various slot sizes, various Materials

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SEM pin stub Ø63 diameter top, standard pin, aluminium

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Engraved Zeiss pin stub Ø12.7 diameter with 4 numbered fields, short pin, aluminium

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FEI F25 short SEM stage adapter set, includes 20mm pillar and 2 locking nuts, M6F

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Hitachi HV20 round SEM stage adapter assembly with M4 screw, compatible with S3500 series, S3000 series and S2000 series SEMs, aluminium/brass

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EM-Tec M-10 calibration standard with 10µm grid pattern

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LaB6 with 90° cone angle 15μm round tip for ISI TEMs

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EM-Tec R51 bulk sample holder for up to Ø51mm, aluminium, pin

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EM-Tec H72 EBSD 70° pre-tilt sample holder for Ø30mm/1-1/4inch mounts, M4

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Hitachi Ø32x12mm M4 angled SEM sample stub, 45 and 90 degree, aluminium

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EM-Tec PrepPod stand for SEM pin stubs

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Hitachi H25 tall height extension pillar only, 25mmxM6

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EM-Tec H3L multi stub holder for 3 x Ø25mm Hitachi stubs, Ø50x6mm, pin

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EM-Tec H3/45 45 degrees multi stub holder for 3 x Ø15mm Hitachi stubs, Ø25x14mm, M4

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EM-Tec S-Clip sample holder with 2xS-Clips double 90° on Ø25.4mm pin stub

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Double sided conductive copper SEM tape 12mm x 33m

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EM-Tec 2.AM high precision tweezers, style 2, flat, sharp fine tips, anti-magnetic stainless steel

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EM-Tec 702A.CT ESD safe PVDF/carbon fibre reinforced tweezers, blunt tips

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Value-Tec set of 6 larger industrial strong tweezers, includes style 110/510/66X/667/682/686, magnetic stainless steel

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EM-Tec 250.AM SEM stub gripper tweezers for Ø25mm cylinder stubs, anti-magnetic stainless steel

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Micro-Tec CTS carbon fibre reinforced PVDF probes, set of all three

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Value-Tec P25B flat nose pliers with brass lined jaws

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Double 90 degree angled SEM pin stub Ø32mm diameter, standard pin, aluminium

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Gilder G200TH TEM grid, thicker 200 square mesh, various materials

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EMR Formvar support film on copper, various square mesh

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EM-Tec TS3 TEM combined test specimen standard

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45 degree angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium

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45/90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium

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FEI F55 tall SEM stage adapter set, includes 50mm pillar, base and 2 locking nuts, M6F

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EM-Tec JV40 versatile SEM stage adapter with M4 screw for JEOL Neoscope JCM6000 and JCM5000

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EM-Tec CXS-6BE BSD calibration standard, materials plus F/C on pin stub

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EM-Tec P70 EBSD 70° pre-tilt holder for pin stubs/holders, Ø12.7x20mm, pin

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EM-Tec CV1 centering vise SEM sample holder for up to 110mm, M4

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EM-Tec CVE1 extension plates 22.5x40x5mm extends CV1 up to 155mm

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JEOL Ø9.5×9.5mm angled SEM sample stub with 45 degree, aluminium

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EMR Holey Carbon support film on nickel, copper or gold on various hexagonal mesh

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EM-Tec SC2 SampleClamp SEM holder, 25x15mm sample area, pin

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EM-Tec HS10 M4 cylinder stub round clamp up to Ø10mm, Ø15x10mm, M4

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EM-Tec RG2 twin geological thin sections top reference holder for 2 petrographic slides up to 48x28mm, M4

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EM-Tec S-Clip sample holder with 1xS-Clip 45° on Ø25.4mm Zeiss pin stub

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EM-Tec AG31 short working time, conductive silver filled epoxy, 14g in 2 syringes

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EM-Tec 4W.AM precision wafer handling tweezers for Ø4/100mm, anti-magnetic stainless steel”

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EM-Tec 709.CN ESD safe PA66/carbon fibre reinforced tweezers, flat tips

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Value-Tec 660.MS industrial strong tweezers, style 660, bent serrated pointed tips, 150mm, magnetic stainless steel

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Micro-Tec PS2 probe set with Micro-Tec PV1 probe holder and Micro-Tec NAS set of 8 fine pointed angled stainless steel needle probes

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Value-Tec VP3 probe with slight curved tip, round handle, 410 stainless steel

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Value-Tec stainless steel crucible tongs, 258mm

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45/90 degree angled SEM pin stub Ø32mm diameter, standard pin, aluminium

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Copper Target, various disk sizes, 99.99% Cu

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EMR Holey Carbon support film on gold, various hexagonal mesh

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DENKA TFE 174

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Cambridge S4 type SEM stub Ø32mm, aluminium

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Zeiss pin stub Ø9.5 diameter top, short pin, aluminium

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EM-Tec ZJ25 Zeiss pin stub adapter for Ø25mm JEOL stubs

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EM-Tec HS25 Hitachi stub extender assembly with locking nut, M6/M4, 25mm L

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EM-Tec Sn on C resolution standard 6, 5nm-30um

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ISI 2 Leg C-Loop Filaments (10/Box)

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EM-Tec VS26 compact double action spring-loaded vise holder for up to 26mm, pin

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EM-Tec H45P fixed 45° pre-tilt holder for pin stubs/holders, Ø12.7x17mm, M4

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Hitachi Ø50x6mm M4 cylinder SEM sample stub, aluminium

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JEOL Ø50x10mm cylinder SEM sample stub, aluminium

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EM-Tec PS3 mini pin stub SampleClamp 0-2mm, Ø12.7mm, pin

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EM-Tec P7 multi pin stub holder for 7 x Ø25.4mm pin stubs, Ø78x15mm, pin

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EM-Tec P12 multi pin stub holder for 12 pin stubs, Ø62×10.5mm, M4

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5 each EM-Tec copper alloy S-Clips with 5 each brass M2x3mm screws

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EM-Tec S-Clip sample holder with 2xS-Clips 45°/90° on Ø25 JEOL SEM stub

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Smooth side wall EM-Tec FIB lift-out grids, Mo, 3 posts

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EM-Tec 15.CS high precision cutting tweezers, 12mm angled edges, carbon steel

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Value-Tec 7.NM general purpose tweezers, style 7, curved fine tips, non-magnetic stainless steel

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Value-Tec 67X.MS fibre grip strong reversed tweezers, style 67X, bent serrated blunt tips, 165mm, magnetic stainless steel

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Micro-Tec BS straight fine needle probe 0.25mm, black enameled, 2×0.25mm, 2×0.35mm, 2×0.45mm, 2×0.55mm

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Micro-Tec MP8 probe with flat tip, 410 stainless steel

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EMR Carbon only support film on copper 200 mesh F1 finder grid

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Double 90 degree angled Zeiss pin stub Ø32mm diameter, short pin, aluminium

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Tungsten Target, various disk sizes, 99.95% W

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EM-Tec folding TEM support grids, various Mesh, various Materials

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SEM pin stub Ø100 diameter top, standard pin, aluminium

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Low profile Zeiss pin stub Ø12.7 diameter with 90°, short pin, aluminium

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FEI F26 SEM stage adapter knurled aluminium locking nut, 4mmxM6F

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Hitachi HV34 dovetail stage adapter with M4 screw for Hitachi S-3400N, aluminium

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EM-Tec CXS-5F light element and EDS calibration standard, 5 materials plus F/C on pin stub

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Denka M3 LaB6 with 90° cone angle 15μm round tip for FEI, Philips, Amray

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EM-Tec G0 universal thin section and slide holder for up to 75x50mm slides, pin

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EM-Tec H70P EBSD 70° pre-tilt holder for pin stubs/holders, Ø12.7x20mm, M4

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Hitachi Ø25x16mm M4 angled SEM sample stub, 45 degree, aluminium

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EM-Tec multi-angle PrepPod stand for SEM pin stubs

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Phenom PHA32 adapter ring to hold 25mm/1 inch diameter mounts in the Phenom metallurgical holder

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EM-Tec H6 multi stub holder for 6 x Ø15mm Hitachi stubs, Ø50x6mm, pin

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EM-Tec P3/45 multi pin stub holder 45° for 3 pin stubs, Ø25x14mm, M4

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EM-Tec PH6 XL mounting pillars for Phenom XL pin plate

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Double sided conductive copper SEM tape 20mm x 16.4m

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EM-Tec 2A.AM high precision tweezers, style 2A, flat accurate round tips, anti-magnetic stainless steel

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EM-Tec 705.CT ESD safe PVDF/carbon fibre reinforced tweezers, fine tips

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Value-Tec 110.MS industrial strong tweezers, style 110, straight serrated pointed tips, 115mm, magnetic stainless steel

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EM-Tec 320.AM SEM stub gripper tweezers for Ø32mm cylinder stubs, anti-magnetic stainless steel

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Micro-Tec GN1 glass fibre reinforced polyamide66 probe, fine pointed / strong flat

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Value-Tec DB2 fine tip air blower/hand duster with non-return valve

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EM-Tec S-Clip sample holder with various number S-Clip on Ø25.4mm pin stub

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Gilder G600TT TEM grid, thick/thin bar 600 square mesh, various materials

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EMR Formvar Carbon support film on copper, various square mesh

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EM-Tec TC1 TEM calibration standard oriented gold crystal

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45 degree angled SEM pin stub Ø25.4 diameter standard pin, aluminium

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