SEM Sample Stubs – EMSIS ASIA – Electron Microscopy Imaging Company

SEM pin stub Ø25.4 diameter top, standard pin, aluminium

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Zeiss pin stub Ø50 diameter top, short pin, aluminium

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Hitachi Ø63x6mm M4 cylinder SEM sample stub, aluminium

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JEOL Ø25x16mm cylinder SEM sample stub, aluminium

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EM-Tec P29 multi pin stub holder for 29 pin stubs, Ø90x7mm, pin

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EM-Tec P6/45 multi pin stub holder 45° for 6 pin stubs, Ø35x14mm, M4

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Engraved SEM pin stub Ø25.4 diameter with 12 numbered fields, aluminium

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45 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium

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Hitachi Ø25x16mm M4 angled SEM sample stub, double 90 degree, aluminium

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EM-Tec multi stub preparation stand for 23 pin stubs

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EM-Tec H3 multi stub holder for 3 x Ø15mm Hitachi stubs, Ø25x6mm, pin

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EM-Tec J3 multi stub holder for 3 x Ø12.2mm JEOL stubs, Ø31.5x10mm cylinder

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SEM pin stub Ø12.7 diameter + 4mm extra height, standard pin, aluminium

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EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin

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JEOL Ø9.5×9.5mm cylinder SEM sample stub, aluminium

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EM-Tec PS8 pin stub round clamp up to Ø6mm, Ø12.7×7.2mm, pin

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EM-Tec HS7 mini M4 cylinder stub dual slot vise clamp, 2x1mm, Ø15x6mm, M4

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JEOL Ø32x12mm angled SEM sample stub with double 90 degree, aluminium

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SEM pin stub Ø32 diameter top, standard pin, aluminium

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Zeiss pin stub Ø63 diameter top, short pin, aluminium

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Hitachi Ø100×4.5mm M4 cylinder SEM sample stub, aluminium

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JEOL Ø25x16mm angled SEM sample stub with 45 and 90 degree, aluminium

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EM-Tec J6 multi stub holder for 6 x Ø12.2mm JEOL stubs, Ø50.0x10mm, pin

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EM-Tec P49 multi pin stub holder for 49 pin stubs, Ø117x7mm, M4

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Engraved SEM pin stub Ø32 diameter with 12 numbered fields, aluminium

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45/90 degree angled Zeiss pin stub Ø12.7 diameter, short pin, aluminium

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Hitachi Ø25x16mm M4 angled SEM sample stub, 45 and 90 degree, aluminium

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EM-Tec multi stub preparation stand for 28 JEOL 9.5mm stubs

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EM-Tec H3L multi stub holder for 3 x Ø25mm Hitachi stubs, Ø50x6mm, pin

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EM-Tec P4 multi pin stub holder for 4 pin stubs, Ø31.5×10.5mm, JEOL 32mm

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SEM pin stub Ø25.4 diameter + 4mm extra height, standard pin, aluminium

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In-lens SEM mount type 1 for Hitachi SU9000, S-5500, S-5200 and S-5000

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JEOL Ø12.2x10mm cylinder SEM sample stub, aluminium

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EM-Tec PS6 mini split pin stub vise clamp 0-6mm, Ø12.7×7.2mm, pin

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EM-Tec P29 multi pin stub holder for 29 pin stubs, Ø90x7mm, M4

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JEOL Ø32x12mm angled SEM sample stub with 45 and 90 degree, aluminium

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SEM pin stub Ø38 diameter top, standard pin, aluminium

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Zeiss pin stub Ø100 diameter top, short pin, aluminium

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Hitachi Ø15x10mm M4 dish SEM sample stub, aluminium

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JEOL Ø25x16mm angled SEM sample stub with double 90 degree, aluminium

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EM-Tec P7 multi pin stub holder for 7 x Ø25.4mm pin stubs, Ø78x15mm, pin

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EM-Tec H3 multi stub holder for 3 x Ø15mm Hitachi stubs, Ø25x6mm, M4

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45 degree angled high profile SEM pin stub Ø12.7 diameter standard pin, aluminium

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Double 45/90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium

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Hitachi Ø25×13.5mm/M6 stem pin type SEM sample stub, aluminium

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EM-Tec multi stub preparation stand for 28 JEOL 12.2mm stubs

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EM-Tec H6 multi stub holder for 6 x Ø15mm Hitachi stubs, Ø50x6mm, pin

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Ø25x5mm spacer discs for EM-Tec reference holder adapter sleeve

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SEM pin stub Ø12.7 diameter + 6mm extra height, standard pin, aluminium

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In-lens SEM mount type 3 for Hitachi SU9000, S-5500, S-5200 and S-5000

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