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JEOL Ø9.5×9.5mm cylinder SEM sample stub, aluminium
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JEOL 12P JEOL Ø12.2mm adapter for pin stubs, Ø12.2x10mm
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JEOL C-Loop Filaments (6/Box)
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JEOL Dish stub, Ø12.2×10 with 1.5mm dish depth, aluminium
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JEOL Ø32x12mm angled SEM sample stub with 45 and 90 degree, aluminium
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JEOL Ø32x12mm angled SEM sample stub with double 90 degree, aluminium
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LaB6 with 90° cone angle 15μm round tip for ISI TEMs
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LaB6 with 90° cone angle 15μm round tip for ISI, ABT, Topcon SEM
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Lightweight Wafer Cleaving Pliers, complete with jaw inserts, 152mm
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Long pin stub adapter with support rim for Hitachi M4 stubs and holders
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Low profile SEM pin stub Ø12.7 diameter with 1mm height, aluminium
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Low profile SEM pin stub Ø12.7 diameter with 35° for Tescan FIBxSEM, aluminium
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Low profile SEM pin stub Ø12.7 diameter with 38° for FEI FIB, aluminium
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Low profile SEM pin stub Ø12.7 diameter with 90°, aluminium
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Low profile Zeiss pin stub Ø12.7 diameter with 1mm height, short pin, aluminium
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Low profile Zeiss pin stub Ø12.7 diameter with 90°, short pin, aluminium
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MAG*I*CAL traceable TEM calibration standard
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Micro-Tec B2 straight fine needle probe 0.25mm, black enameled steel, 35mm
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Micro-Tec B3 straight fine needle probe 0.35mm, black enameled steel, 35mm
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Micro-Tec B4 straight fine needle probe 0.45mm, black enameled steel, 35mm
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Micro-Tec B5 straight fine needle probe 0.55mm, black enameled steel, 35mm
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Micro-Tec conductive silver grease, 7g syringe
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Micro-Tec CP1 carbon fibre reinforced PEEK probe, fine pointed / strong flat
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Micro-Tec CP2 carbon fibre reinforced PEEK probe, curved pointed / strong
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Micro-Tec CP3 carbon fibre reinforced PEEK probe, sharp flat / large flat
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Micro-Tec CPS carbon fibre reinforced PEEK probes, set of all three
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Micro-Tec CT1 carbon fibre reinforced PVDF probe, fine pointed / strong flat
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Micro-Tec CT2 carbon fibre reinforced PVDF probe, curved pointed / strong flat
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Micro-Tec CT3 carbon fibre reinforced PVDF probe, sharp flat / large flat
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Micro-Tec CTS carbon fibre reinforced PVDF probes, set of all three
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Micro-Tec disposable carbon steel scalpels #10 with plastic handle, sterile
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Micro-Tec disposable carbon steel scalpels #11 with plastic handle, sterile
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Micro-Tec disposable carbon steel scalpels #15 with plastic handle, sterile
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Micro-Tec disposable carbon steel scalpels #20 with plastic handle, sterile
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Micro-Tec disposable carbon steel scalpels #22 with plastic handle, sterile
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Micro-Tec ESD safe mini vacuum pick-up tool with 4 tips and 4 vacuum cups
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Micro-Tec ESD safe vacuum pick-up pen with 2 tips and 3 vacuum cups
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Micro-Tec GN3 glass fibre reinforced polyamide66 probe, sharp flat / large flat
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Micro-Tec GNS glass fibre reinforced polyamide66 probes, set of all three
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Micro-Tec MP1 probe with straight tip, 410 stainless steel
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Micro-Tec MP2 probe with bend tip, 410 stainless steel
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Micro-Tec MP4 probe with bend hook tip, 410 stainless steel
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Micro-Tec MP5 probe with curved hook tip, 410 stainless steel
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Micro-Tec MP7 probe with angled hook tip, 410 stainless steel
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Micro-Tec MP8 probe with flat tip, 410 stainless steel
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Micro-Tec MTC-5 Multiple target calibration standard with 4 patterns
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Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns
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Micro-Tec N2 straight fine needle probe 0.25mm, stainless steel, 35mm
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Micro-Tec N3 straight fine needle probe 0.35mm, stainless steel, 35mm
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Micro-Tec N4 straight fine needle probe 0.45mm, stainless steel, 35mm
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Micro-Tec N5 straight fine needle probe 0.55mm, stainless steel, 35mm
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Micro-Tec NA2 angled fine needle probe 0.25mm, stainless steel, 35mm
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Micro-Tec NA3 angled fine needle probe 0.35mm, stainless steel, 35mm
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Micro-Tec NA4 angled fine needle probe 0.45mm, stainless steel, 35mm
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Micro-Tec NA5 angled fine needle probe 0.55mm, stainless steel, 35mm
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Molydenum Target, Ø57 x 0.25mm Disc, 99.95% Mo
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Nickel Target, various disk sizes, 99.98% Ni
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Niobium Target, Ø57 x 0.25mm Disc, 99.95% Nb
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Palladium Target, various disk sizes, 99.99% Pd
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Palladium Target, various sizes Annular on Support Ring, 99.99% Pd
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Pemtron PV64 round SEM stage adapter with flat and M4 threaded top, brass
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Phenom PH22 bulk holder up to Ø22x12mm for Phenom metallurgical sample holder
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Phenom PH32 vise clamp up to 22mm thick for Phenom metallurgical sample holder
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Platinum Target, various sizes Annular on Support Ring, 99.99% Pt
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Platinum Target,various disk sizes, 99.99% Pt
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Platinum/Palladium Target, various disk sizes, Pt/Pd 80/20, 99.99% Pt/Pd
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Replacement brass float bar for Hitachi HV40 T-base SEM stage adapter, brass
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SEM Dish pin stub, Ø12.7x7mm with 1.5mm dish depth, aluminium
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SEM pin stub Ø100 diameter top, standard pin, aluminium
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SEM pin stub Ø12.7 diameter + 4mm extra height, standard pin, aluminium
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SEM pin stub Ø12.7 diameter + 6mm extra height, standard pin, aluminium
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SEM pin stub Ø12.7 diameter top, standard pin, aluminium
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SEM pin stub Ø12.7 diameter top, standard pin, brass
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SEM pin stub Ø12.7 diameter top, with flat, standard pin, aluminium
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SEM pin stub Ø19 diameter top, standard pin, aluminium
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SEM pin stub Ø25.4 diameter + 4mm extra height, standard pin, aluminium
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SEM pin stub Ø25.4 diameter top, standard pin, aluminium
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SEM pin stub Ø32 diameter top, standard pin, aluminium
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SEM pin stub Ø38 diameter top, standard pin, aluminium
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SEM pin stub Ø50 diameter top, standard pin, aluminium
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SEM pin stub Ø6.4 diameter top, standard pin, aluminium
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SEM pin stub Ø63 diameter top, standard pin, aluminium
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SEM pin stub Ø9.5 diameter top, standard pin, aluminium
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Silver Target, various sizes Annular on Support Ring, 99.99% Ag
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Silver Target, various disc sizes, 99.97% Ag
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Smooth side wall EM-Tec FIB lift-out grids, Mo, 3 posts
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Super fine SEM marker pen, black
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Tantalum Target, various disk sizes, 99.95% Ta
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Tescan/Zeiss V-Loop (10/Box)
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Titanium Target, various disk sizes, 99.6+% Ti
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Tungsten Target, various disk sizes, 99.95% W
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