产品 – 第4页 – EMSIS ASIA – Electron Microscopy Imaging Company

Micro-Tec GN2 glass fibre reinforced polyamide66 probe, curved pointed / strong flat

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Micro-Tec GN1 glass fibre reinforced polyamide66 probe, fine pointed / strong flat

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Micro-Tec ESD safe vacuum pick-up pen with 2 tips and 3 vacuum cups

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Micro-Tec ESD safe mini vacuum pick-up tool with 4 tips and 4 vacuum cups

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Micro-Tec disposable carbon steel scalpels set with plastic handle contains 2x #10/11/15/20/22, sterile

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Micro-Tec disposable carbon steel scalpels #22 with plastic handle, sterile

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Micro-Tec disposable carbon steel scalpels #20 with plastic handle, sterile

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Micro-Tec disposable carbon steel scalpels #15 with plastic handle, sterile

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Micro-Tec disposable carbon steel scalpels #11 with plastic handle, sterile

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Micro-Tec disposable carbon steel scalpels #10 with plastic handle, sterile

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Micro-Tec CTS carbon fibre reinforced PVDF probes, set of all three

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Micro-Tec CT3 carbon fibre reinforced PVDF probe, sharp flat / large flat

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Micro-Tec CT2 carbon fibre reinforced PVDF probe, curved pointed / strong flat

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Micro-Tec CT1 carbon fibre reinforced PVDF probe, fine pointed / strong flat

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Micro-Tec CPS carbon fibre reinforced PEEK probes, set of all three

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Micro-Tec CP3 carbon fibre reinforced PEEK probe, sharp flat / large flat

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Micro-Tec CP2 carbon fibre reinforced PEEK probe, curved pointed / strong

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Micro-Tec CP1 carbon fibre reinforced PEEK probe, fine pointed / strong flat

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Micro-Tec conductive silver grease, 7g syringe

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Micro-Tec C5 straight fine needle probe 0.40mm, nickel plated carbon tool steel, 28mm

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Micro-Tec BS straight fine needle probe 0.25mm, black enameled, 2×0.25mm, 2×0.35mm, 2×0.45mm, 2×0.55mm

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Micro-Tec B5 straight fine needle probe 0.55mm, black enameled steel, 35mm

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Micro-Tec B4 straight fine needle probe 0.45mm, black enameled steel, 35mm

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Micro-Tec B3 straight fine needle probe 0.35mm, black enameled steel, 35mm

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Micro-Tec B2 straight fine needle probe 0.25mm, black enameled steel, 35mm

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MAG*I*CAL traceable TEM calibration standard

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Low profile Zeiss pin stub Ø12.7 diameter with 90°, short pin, aluminium

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Low profile Zeiss pin stub Ø12.7 diameter with 36° for Zeiss SEM/ FIB systems, short pin, aluminium

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Low profile Zeiss pin stub Ø12.7 diameter with 1mm height, short pin, aluminium

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Low profile SEM pin stub Ø12.7 diameter with 90°, aluminium

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Low profile SEM pin stub Ø12.7 diameter with 38° for FEI FIB, aluminium

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Low profile SEM pin stub Ø12.7 diameter with 35° for Tescan FIBxSEM, aluminium

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Low profile SEM pin stub Ø12.7 diameter with 1mm height, aluminium

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Long pin stub adapter with support rim for Hitachi M4 stubs and holders

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Lightweight Wafer Cleaving Pliers, complete with jaw inserts, 152mm

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LCS-10 Micro-Tec 10mm linear compound scale, 1, 0.1, 0.01mm div., Si/Cr, opaque, different mounts

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LaB6 with 90° cone angle 15μm round tip for ISI, ABT, Topcon SEM

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LaB6 with 90° cone angle 15μm round tip for ISI TEMs

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JEOL Ø32x12mm angled SEM sample stub with double 90 degree, aluminium

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JEOL Ø32x12mm angled SEM sample stub with 45 and 90 degree, aluminium

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JEOL Dish stub, Ø12.2×10 with 1.5mm dish depth, aluminium

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JEOL C-Loop Filaments (6/Box)

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JEOL 12P JEOL Ø12.2mm adapter for pin stubs, Ø12.2x10mm

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JEOL Ø9.5×9.5mm cylinder SEM sample stub, aluminium

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JEOL Ø9.5×9.5mm angled SEM sample stub with 45 degree, aluminium

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JEOL Ø9.5×9.5mm angled SEM sample stub with 45 and 90 degree, aluminium

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JEOL Ø9.5x5mm cylinder SEM sample stub, aluminium

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JEOL Ø50x5mm cylinder SEM sample stub, aluminium

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JEOL Ø50x10mm cylinder SEM sample stub, aluminium

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JEOL Ø32x5mm cylinder SEM sample stub, aluminium

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