Other SEM Stubs – EMSIS ASIA – Electron Microscopy Imaging Company

Cambridge S4 type SEM stub Ø32mm, aluminium

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EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin

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Gatan 3View system SEM pin stubs with large Ø2.4mm flat, Ø2mm pin x12.5mm H, aluminium

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Gatan 3View system SEM pin stubs with standard Ø1.4mm flat, Ø2mm pin x12.5mm H, aluminium

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ISI/ABT/Topcon Ø15x10mm SEM cylinder sample stub, aluminium

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Low profile SEM pin stub Ø12.7 diameter with 35° for Tescan FIBxSEM, aluminium

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70 degree EBSD angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium

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EM-Tec cryo pin for ultramicrotomes, Ø2x10mm, aluminium

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