EM-Tec F12 is a basic yet practical FIB grid holder with pin for 2 FIB grids. Based on the standard Ø12.7mm pin stub it is compact and useful for storing valuable samples. The 10mm wide vise clamp includes a ledge for easy positioning of the FIB grids
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5 each EM-Tec copper alloy S-Clips with 5 each brass M2x3mm screws
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6 each S-Clip stand-off pillars, 4mm height, M2x3 male/female
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EM-Tec B26 bulk sample holder for up 26mm, aluminium, M4
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EM-Tec B26 bulk sample holder for up 26mm, aluminium, pin
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EM-Tec CV1 centering vise SEM sample holder for up to 110mm, M4
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EM-Tec CV1 centering vise SEM sample holder for up to 110mm, pin
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EM-Tec CVC1 standard triple grooved/smooth vise jaw, 12x40x6mm
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EM-Tec CVC2 single large 120 degrees groove vise jaw, 12x40x6mm
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EM-Tec CVE1 extension plates 22.5x40x5mm extends CV1 up to 155mm
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EM-Tec F12 compact FIB grid holder for up to 2 FIB grids, pin
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EM-Tec F25 FIB grid holder for up to 5 FIB grids, M4
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EM-Tec F25 is a larger FIB grid holder with a M4 threaded hole which can accommodate up to 4 FIB grids of the same thickness. The 25mm wide vise include a ledge for easy positioning of the FIB grids and two brass thumb screws to operate the vise
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EM-Tec F25 FIB grid holder for up to 5 FIB grids, pin
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EM-Tec F25 is a larger FIB grid holder with pin which can accommodate up to 4 FIB grids of the same thickness. The 25mm wide vise include a ledge for easy positioning of the FIB grids and two brass thumb screws to operate the vise.
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EM-Tec FS21 combines the EM-Tec F12 FIB grid holder with two standard 12.7mm (1/2) pin stubs. The F12 FIB grid holder and the sample stubs can be rotated in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS21 FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples
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EM-Tec FS21 combines the EM-Tec F12 FIB grid holder with two standard 12.7mm (1/2) pin stubs. The F12 FIB grid holder and the sample stubs can be rotated in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS21 FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples
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EM-Tec FS22 combines two F12 FIB grid holders with two standard 12.7mm (1/1) pin stubs within a 27x27mm footprint. Both the F12 FIB grid holders and the pin stubs can be rotated independently in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS22 dual FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples.
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EM-Tec FS22 combines two F12 FIB grid holders with two standard 12.7mm (1/1) pin stubs within a 27x27mm footprint. Both the F12 FIB grid holders and the pin stubs can be rotated independently in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS22 dual FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples
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EM-Tec FS25 with pin M4 thread. Combines the the wider FIB grid holder vise with a holder for samples on the Ø25.4mm pin stubs in a single compact holder. This provides a single loading cycle for FIB grids and samples and short distances from form lift-out to lamellae mounting. Wafer type sample surface is at the same height as the FIB grid posts.
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EM-Tec FS25 with pin stub. Combines the the wider FIB grid holder vise with a holder for samples on the Ø25.4mm pin stubs in a single compact holder. This provides a single loading cycle for FIB grids and samples and short distances from form lift-out to lamellae mounting. Wafer type sample surface is at the same height as the FIB grid posts.
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EM-Tec GB16 bulk sample holder for up 16mm, gilded brass, M4
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EM-Tec GB16 bulk sample holder for up 16mm, gilded brass, pin
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EM-Tec GR2 needle / tube sample holder for up to Ø2mm, gold plated brass, pin
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EM-Tec GR20 bulk sample holder for up to Ø20mm, gilded brass, M4
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EM-Tec GR20 bulk sample holder for up to Ø20mm, gilded brass, pin
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EM-Tec GS10 swivel head sample holder for up 10mm, gold plated brass, pin
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EM-Tec H45P fixed 45° pre-tilt holder for pin stubs/holders, Ø12.7x17mm, M4
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EM-Tec H70P EBSD 70° pre-tilt holder for pin stubs/holders, Ø12.7x20mm, M4
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EM-Tec H71 EBSD 70° pre-tilt sample holder for Ø25mm/1inch mounts, M4
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EM-Tec H72 EBSD 70° pre-tilt sample holder for Ø30mm/1-1/4inch mounts, M4
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EM-Tec HS10 M4 cylinder stub round clamp up to Ø10mm, Ø15x10mm, M4
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EM-Tec HS3 mini M4 cylinder stub SampleClamp 0-2mm , Ø15x10mm, M4
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EM-Tec HS6 mini M4 cylinder stub vise clamp 0-6mm, Ø15x10mm, M4
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